Invention Grant
- Patent Title: Analysis apparatus
- Patent Title (中): 分析仪
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Application No.: US12505904Application Date: 2009-07-20
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Publication No.: US08260571B2Publication Date: 2012-09-04
- Inventor: Tetsuyuki Kubota , Nobutaka Itoh
- Applicant: Tetsuyuki Kubota , Nobutaka Itoh
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2008-188147 20080722
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G06F15/00

Abstract:
An analysis apparatus includes an assignor assigning a physical property value corresponding to the kind of a material to each of regions formed by dividing a structural data representing a structure of a multilayer substrate, a determiner determining whether or not the each of the region belongs to a predetermined region in a layer of a predetermined kind, and a physical property value changer changing the physical property value of the region belonging to a predetermined region in a layer of a predetermined kind.
Public/Granted literature
- US20100023299A1 ANALYSIS APPARATUS Public/Granted day:2010-01-28
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