Invention Grant
- Patent Title: Diagnostic device for material handling system and method of diagnosing
- Patent Title (中): 材料处理系统诊断装置及诊断方法
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Application No.: US12341561Application Date: 2008-12-22
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Publication No.: US08260574B1Publication Date: 2012-09-04
- Inventor: Dennis J. Schuitema , Kenneth J. Kooistra , Stephen C. Wolf , Matthew A. Steenwyk
- Applicant: Dennis J. Schuitema , Kenneth J. Kooistra , Stephen C. Wolf , Matthew A. Steenwyk
- Applicant Address: US MI Grand Rapids
- Assignee: Dematic Corp.
- Current Assignee: Dematic Corp.
- Current Assignee Address: US MI Grand Rapids
- Agency: Gardner, Linn, Burkhart & Flory, LLP
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A technique is provided for diagnosing deficiencies in a material handling system having a track and a material support member adapted to travel on the track. A diagnostic device travels with the material support member and includes one or more sensors that measure one or more parameters of the material support member. Such parameters may include an amount of force exerted laterally against one or more restraining members or the accelerations of the material support member. The material handling system may include a plurality of slats connected in an endless web that defines a conveying surface upon which articles are transported.
Public/Granted literature
- US3184455A Anthraquinone dyestuffs and process for their production Public/Granted day:1965-05-18
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