Invention Grant
- Patent Title: Apparatus, a method and a program thereof
- Patent Title (中): 装置，方法和程序
-
Application No.: US13009565Application Date: 2011-01-19
-
Publication No.: US08261137B2Publication Date: 2012-09-04
- Inventor: Takato Sekimoto
- Applicant: Takato Sekimoto
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-009992 20100120
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G11C29/00
Abstract:
An apparatus and method for efficiently processing memory faults. A faulty memory is exchanged with a spare memory when the total number of faults in the memories is over a threshold. After the switching, when the number of faults in a single cache line is over a threshold, a memory page corresponding to the single cache line is blocked.
Public/Granted literature
- US20110179318A1 APPARATUS, A METHOD AND A PROGRAM THEREOF Public/Granted day:2011-07-21
Information query
