Invention Grant
- Patent Title: Uninitialized memory detection using error correction codes and built-in self test
- Patent Title (中): 未初始化的内存检测使用纠错码和内置自检
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Application No.: US13187657Application Date: 2011-07-21
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Publication No.: US08261140B2Publication Date: 2012-09-04
- Inventor: Yair Orbach , Assaf Rachlevski
- Applicant: Yair Orbach , Assaf Rachlevski
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Christopher P. Maiorana, PC
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
An apparatus having a memory module and an initialization module is disclosed. The initialization module may be configured to (i) mark a particular location in the memory module as an uninitialized location by writing a predetermined word into the particular location in response to an occurrence of an event, (ii) read a read word from an address in the memory module in response to a read cycle and (iii) generate an interrupt signal by analyzing the read word, the interrupt signal being asserted where the read word indicates that the address is the uninitialized location in the memory module.
Public/Granted literature
- US20110276846A1 UNINITIALIZED MEMORY DETECTION USING ERROR CORRECTION CODES AND BUILT-IN SELF TEST Public/Granted day:2011-11-10
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