Invention Grant
US08261140B2 Uninitialized memory detection using error correction codes and built-in self test 失效
未初始化的内存检测使用纠错码和内置自检

Uninitialized memory detection using error correction codes and built-in self test
Abstract:
An apparatus having a memory module and an initialization module is disclosed. The initialization module may be configured to (i) mark a particular location in the memory module as an uninitialized location by writing a predetermined word into the particular location in response to an occurrence of an event, (ii) read a read word from an address in the memory module in response to a read cycle and (iii) generate an interrupt signal by analyzing the read word, the interrupt signal being asserted where the read word indicates that the address is the uninitialized location in the memory module.
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