Invention Grant
- Patent Title: Locating a testable object in a functional testing tool
- Patent Title (中): 在功能测试工具中找到可测试的对象
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Application No.: US10745822Application Date: 2003-12-23
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Publication No.: US08261239B2Publication Date: 2012-09-04
- Inventor: Frank McGrath , Mark Metheny , Kenneth Sandler , William C. Tobin
- Applicant: Frank McGrath , Mark Metheny , Kenneth Sandler , William C. Tobin
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Carey, Rodriguez, Greenberg & O'Keefe
- Agent Steven M. Greenberg, Esq.
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F3/00

Abstract:
A method, system and apparatus for locating a testable object in a functional testing tool is provided. The method can include comparing object properties for a mapped testable object to object properties for each of a set of candidate testable objects organized in a hierarchy, computing an anchor object in the hierarchy, and determining a best matching candidate testable object for the mapped testable object without requiring an exact match of the object properties while constraining the comparing and determining steps with respect to the anchor object.
Public/Granted literature
- US20040194054A1 Locating a testable object in a functional testing tool Public/Granted day:2004-09-30
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