Invention Grant
- Patent Title: Method of producing zinc oxide semiconductor crystal
- Patent Title (中): 生产氧化锌半导体晶体的方法
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Application No.: US12305802Application Date: 2007-06-22
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Publication No.: US08268075B2Publication Date: 2012-09-18
- Inventor: Koji Omichi , Yoshikazu Kaifuchi , Munehisa Fujimaki , Akihiko Yoshikawa
- Applicant: Koji Omichi , Yoshikazu Kaifuchi , Munehisa Fujimaki , Akihiko Yoshikawa
- Applicant Address: JP Tokyo JP Chiba
- Assignee: Fujikura Ltd.,Chiba University
- Current Assignee: Fujikura Ltd.,Chiba University
- Current Assignee Address: JP Tokyo JP Chiba
- Agency: Sughrue Mion, PLLC
- Priority: JP2006-172613 20060622
- International Application: PCT/JP2007/062634 WO 20070622
- International Announcement: WO2007/148802 WO 20071227
- Main IPC: C30B23/00
- IPC: C30B23/00 ; C30B25/00 ; C30B28/12 ; C30B28/14

Abstract:
A method of producing a zinc oxide-based semiconductor crystal, including: introducing at least zinc and oxygen on a surface of a substrate; and growing a zinc oxide-based semiconductor crystal on the substrate, wherein a total or partial portion of the zinc is ionized in a vacuum atmosphere of 1×10−4 Torr or less and is introduced to the surface of the substrate to grow the ZnO based semiconductor crystal. As a result, it is possible to provide a method of producing a zinc oxide based semiconductor crystal capable of growing a zinc oxide semiconductor crystal having excellent surface flatness and crystallinity and including an extremely small amount of impurities at a high growth rate.
Public/Granted literature
- US20090260563A1 METHOD OF PRODUCING ZINC OXIDE SEMICONDUCTOR CRYSTAL Public/Granted day:2009-10-22
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