Invention Grant
- Patent Title: Surface roughening process
- Patent Title (中): 表面粗糙化处理
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Application No.: US11827709Application Date: 2007-07-13
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Publication No.: US08268703B2Publication Date: 2012-09-18
- Inventor: Bernard Aspar , Chrystelle Lagahe Blanchard , Nicolas Sousbie
- Applicant: Bernard Aspar , Chrystelle Lagahe Blanchard , Nicolas Sousbie
- Applicant Address: FR Bernin
- Assignee: S.O.I.TEC Silicon on Insulator Technologies
- Current Assignee: S.O.I.TEC Silicon on Insulator Technologies
- Current Assignee Address: FR Bernin
- Agency: Edwards Wildman Palmer LLP
- Agent George W. Neuner; George N. Chaclas
- Priority: FR0752805 20070122
- Main IPC: H01L21/30
- IPC: H01L21/30

Abstract:
A process of forming a rough interface in a semiconductor substrate. The process includes the steps of depositing a material on a surface of the substrate, forming a zone of irregularities in the material, and forming a rough interface in the semiconductor substrate by a thermal oxidation of the material and a part of the substrate. Additionally, the surface of the oxidized material may be prepared and the surface may be assembled with a second substrate.
Public/Granted literature
- US20080176381A1 Surface roughening process Public/Granted day:2008-07-24
Information query
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