Invention Grant
US08269268B2 Charge trap flash memory device and memory card and system including the same
有权
充电陷阱闪存设备和存储卡及系统包括相同
- Patent Title: Charge trap flash memory device and memory card and system including the same
- Patent Title (中): 充电陷阱闪存设备和存储卡及系统包括相同
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Application No.: US12080315Application Date: 2008-04-02
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Publication No.: US08269268B2Publication Date: 2012-09-18
- Inventor: Zong-liang Huo , In-seok Yeo , Seung-Hyun Lim , Kyong-hee Joo , Jun-kyu Yang
- Applicant: Zong-liang Huo , In-seok Yeo , Seung-Hyun Lim , Kyong-hee Joo , Jun-kyu Yang
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Onello & Mello, LLP
- Priority: KR10-2007-0032939 20070403
- Main IPC: H01L29/792
- IPC: H01L29/792

Abstract:
The device includes: a tunnel insulating layer, a charge trap layer; a blocking insulating layer; and a gate electrode sequentially formed on a substrate. The charge trap layer includes: plural trap layers comprising a first material having a first band gap energy level; spaced apart nanodots, each nanodot being at least partially surrounded by at least one of the trap layers, wherein the nanodots comprise a second material having a second band gap energy level that is lower than the first band gap energy level; and an intermediate blocking layer comprising a third material having a third band gap energy level that is higher than the first band gap energy level, formed between at least two of the trap layers. This structure prevents loss of charges from the charge trap layer and improves charge storage capacity.
Public/Granted literature
- US20080246078A1 Charge trap flash memory device and memory card and system including the same Public/Granted day:2008-10-09
Information query
IPC分类: