Invention Grant
- Patent Title: Device for testing surface mounted connectors
- Patent Title (中): 用于测试表面贴装连接器的装置
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Application No.: US12802114Application Date: 2010-05-29
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Publication No.: US08269507B2Publication Date: 2012-09-18
- Inventor: James Hall
- Applicant: James Hall
- Agency: Brande & McCleary
- Agent Lewis M Brande; Thomas A McCleary
- Main IPC: G01R31/04
- IPC: G01R31/04

Abstract:
This invention describes a device for testing a surface mounted connector using a test probe assembly that utilizes a vacuum to force the test wires and the test probe's wire array into intimate contact with the connector to be tested. The wires are directed through a wire module assembly and have a wide spacing at one end, and a narrow spacing corresponding to the spacing required for the specific units to be tested at the opposite end. The wires are kept in contact with the unit under test by the use of spring loaded test connectors and vacuum.
Public/Granted literature
- US20110291664A1 Device for testing surface mounted connectors Public/Granted day:2011-12-01
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