A method and apparatus for a pre-biasing storage mechanism to prevent oxidation and other contaminants from forming on the probe tips and probe tails of a probe card. The pre-biasing storage mechanism imposes a positive bias on the probe needles of the probe card so as to create physical contact between the probe tails and the conductive pads of the printed circuit board (PCB) arrangement of the probe card during a disengaged state of the probe card. In addition, the storage mechanism imposes a positive bias on the probe needles of the probe card, so as to create physical contact between the probe tips and a probe tip cleaning pad, or other protective surface, during a disengaged state of the probe card.