Invention Grant
US08269946B2 Cleanup method for optics in immersion lithography supplying cleaning liquid at different times than immersion liquid 有权
浸没光刻中的光学清理方法,在浸没液体的不同时间提供清洗液

  • Patent Title: Cleanup method for optics in immersion lithography supplying cleaning liquid at different times than immersion liquid
  • Patent Title (中): 浸没光刻中的光学清理方法,在浸没液体的不同时间提供清洗液
  • Application No.: US12379171
    Application Date: 2009-02-13
  • Publication No.: US08269946B2
    Publication Date: 2012-09-18
  • Inventor: Hidemi Kawai
  • Applicant: Hidemi Kawai
  • Applicant Address: JP Tokyo
  • Assignee: Nikon Corporation
  • Current Assignee: Nikon Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Oliff & Berridge, PLC
  • Main IPC: G03B27/52
  • IPC: G03B27/52
Cleanup method for optics in immersion lithography supplying cleaning liquid at different times than immersion liquid
Abstract:
A lithographic apparatus includes a substrate table on which a substrate is held, a projection system including a final optical element, the projection system projecting a patterned beam of radiation through an immersion liquid onto the substrate adjacent the final optical element to expose the substrate during an immersion lithography process, and a liquid supply system including an inlet. The liquid supply system supplies the immersion liquid during the immersion lithography process and supplies a cleaning liquid, which is different from the immersion liquid, during a cleanup process. The cleanup process and the immersion lithography process are performed at different times.
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