Invention Grant
US08269952B2 Sample analyzer including a high frequency control component and sample analyzing method 有权
样品分析仪,包括高频控制组件和样品分析方法

  • Patent Title: Sample analyzer including a high frequency control component and sample analyzing method
  • Patent Title (中): 样品分析仪,包括高频控制组件和样品分析方法
  • Application No.: US12229783
    Application Date: 2008-08-27
  • Publication No.: US08269952B2
    Publication Date: 2012-09-18
  • Inventor: Kunio Ueno
  • Applicant: Kunio Ueno
  • Applicant Address: JP Kobe
  • Assignee: Sysmex Corporation
  • Current Assignee: Sysmex Corporation
  • Current Assignee Address: JP Kobe
  • Agency: Brinks Hofer Gilson & Lione
  • Priority: JP2007-219632 20070827
  • Main IPC: G01N33/48
  • IPC: G01N33/48
Sample analyzer including a high frequency control component and sample analyzing method
Abstract:
The present invention is to present a sample analyzer capable of automatically stabilizing the laser diode in multi-mode oscillation. A sample analyzer 1 comprises: a laser diode (LD) 501d for irradiating a sample with laser light; a photodiode (PD) 501e for detecting amount of light emitted from the LD 501d; a APC circuit 501b for outputting a direct current to be supplied to the LD 501d such that the amount of light emitted from the LD 501d is maintained at a predetermined amount, based on the amount of light detected by the PD 501e; a high frequency oscillation circuit 501f for superimposing a high frequency component on the direct current outputted from the APC circuit 501b; and a high frequency automatic adjustment circuit 501c for controlling amplitude of the high frequency component outputted from the high frequency oscillation circuit 501f according to magnitude of the direct current outputted from the APC circuit 501b such that the LD 501d oscillates in a multi-mode.
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