Invention Grant
- Patent Title: Apparatus for observing the surface of a sample
- Patent Title (中): 用于观察样品表面的装置
-
Application No.: US12679357Application Date: 2008-09-23
-
Publication No.: US08269983B2Publication Date: 2012-09-18
- Inventor: Sipke Wadman
- Applicant: Sipke Wadman
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP07117020 20070924
- International Application: PCT/IB2008/053864 WO 20080923
- International Announcement: WO2009/040732 WO 20090402
- Main IPC: G01B11/30
- IPC: G01B11/30 ; G01N21/55 ; A61N5/01
Abstract:
An apparatus for observing the appearance of a surface of a sample of semitransparent material, the apparatus comprising a light source for illuminating at least a region of interest of the surface of the sample from a predetermined direction and means for observing a response to the illumination of the region of interest, wherein the illuminated region comprises the region of interest and a region surrounding the region of interest. In this way the influence of emitted scattered light on the accuracy of the observation of the appearance of the sample is minimized.
Public/Granted literature
- US20100208273A1 APPARATUS FOR OBSERVING THE SURFACE OF A SAMPLE Public/Granted day:2010-08-19
Information query
