Invention Grant
US08270238B2 Integrated circuits and methods to compensate for defective non-volatile embedded memory in one or more layers of vertically stacked non-volatile embedded memory
有权
用于补偿一个或多个垂直堆叠非易失性嵌入式存储器层中的有缺陷的非易失性嵌入式存储器的集成电路和方法
- Patent Title: Integrated circuits and methods to compensate for defective non-volatile embedded memory in one or more layers of vertically stacked non-volatile embedded memory
- Patent Title (中): 用于补偿一个或多个垂直堆叠非易失性嵌入式存储器层中的有缺陷的非易失性嵌入式存储器的集成电路和方法
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Application No.: US12932890Application Date: 2011-03-08
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Publication No.: US08270238B2Publication Date: 2012-09-18
- Inventor: Robert Norman
- Applicant: Robert Norman
- Applicant Address: US CA Sunnyvale
- Assignee: Unity Semiconductor Corporation
- Current Assignee: Unity Semiconductor Corporation
- Current Assignee Address: US CA Sunnyvale
- Agency: Stolowitz Ford Cowger LLP
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C29/00

Abstract:
Embodiments of the invention relate generally to data storage and computer memory, and more particularly, to systems, integrated circuits and methods to compensate for defective memory in third dimension memory technology. In a specific embodiment, an integrated circuit is configured to compensate for defective memory cells. For example, the integrated circuit can include a memory having memory cells that are disposed in multiple layers of memory. It can also include a memory reclamation circuit configured to substitute a subset of the memory cells for one or more defective memory cells. At least one memory cell in the subset of the memory cells resides in a different plane in the memory than at least one of the one or more defective memory cells.
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