Invention Grant
- Patent Title: Current leakage reduction
- Patent Title (中): 电流泄漏减少
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Application No.: US12784025Application Date: 2010-05-20
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Publication No.: US08270240B2Publication Date: 2012-09-18
- Inventor: Sung-Chieh Lin , Kuoyuan (Peter) Hsu , Jiann-Tseng Huang , We-Li Liao
- Applicant: Sung-Chieh Lin , Kuoyuan (Peter) Hsu , Jiann-Tseng Huang , We-Li Liao
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman Ham and Berner, LLP
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
An OTP memory array includes a bit line coupled to a plurality of memory banks. Each memory bank includes a plurality of memory cells, a footer, and a bias device, and is associated with a current mirror. When a memory cell is activated (e.g., for reading) the memory bank including the activated memory cell is referred to as an activated memory bank and other banks are referred to as deactivated memory banks. A current tracking device serves to compensate for bit line leakage current in deactivated memory cells in the activated memory bank. Further, footers and bias devices in deactivated memory banks and associated current mirrors are configured to reduce/eliminate bit line current leakage through deactivated memory cells in deactivated memory banks.
Public/Granted literature
- US20110026354A1 CURRENT LEAKAGE REDUCTION Public/Granted day:2011-02-03
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