Invention Grant
US08270274B2 Optical disk inspection device and inspection method 失效
光盘检查装置及检查方法

  • Patent Title: Optical disk inspection device and inspection method
  • Patent Title (中): 光盘检查装置及检查方法
  • Application No.: US12580095
    Application Date: 2009-10-15
  • Publication No.: US08270274B2
    Publication Date: 2012-09-18
  • Inventor: Keishi Ueno
  • Applicant: Keishi Ueno
  • Applicant Address: JP Tama-shi, Tokyo
  • Assignee: TEAC Corporation
  • Current Assignee: TEAC Corporation
  • Current Assignee Address: JP Tama-shi, Tokyo
  • Agency: Seed IP Law Group PLLC
  • Priority: JP2008-266441 20081015
  • Main IPC: G11B20/18
  • IPC: G11B20/18
Optical disk inspection device and inspection method
Abstract:
There is provided an optical disk device which quickly inspects the presence or absence of a defect in an optical disk in order to ensure that it can be played back on various types of optical disk devices. A detection unit uses signals supplied from a playback unit to detect defects from each of an RF signal, a focus error signal, and a tracking error signal. A CPU stores positions of the defects in a memory. The playback unit plays back data while degrading playback conditions at the positions of the defects . The detection unit detects an error rate of the played-back data, and finally determines whether the optical disk is “OK” or “NG”.
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