Invention Grant
- Patent Title: Optical disk inspection device and inspection method
- Patent Title (中): 光盘检查装置及检查方法
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Application No.: US12580095Application Date: 2009-10-15
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Publication No.: US08270274B2Publication Date: 2012-09-18
- Inventor: Keishi Ueno
- Applicant: Keishi Ueno
- Applicant Address: JP Tama-shi, Tokyo
- Assignee: TEAC Corporation
- Current Assignee: TEAC Corporation
- Current Assignee Address: JP Tama-shi, Tokyo
- Agency: Seed IP Law Group PLLC
- Priority: JP2008-266441 20081015
- Main IPC: G11B20/18
- IPC: G11B20/18

Abstract:
There is provided an optical disk device which quickly inspects the presence or absence of a defect in an optical disk in order to ensure that it can be played back on various types of optical disk devices. A detection unit uses signals supplied from a playback unit to detect defects from each of an RF signal, a focus error signal, and a tracking error signal. A CPU stores positions of the defects in a memory. The playback unit plays back data while degrading playback conditions at the positions of the defects . The detection unit detects an error rate of the played-back data, and finally determines whether the optical disk is “OK” or “NG”.
Public/Granted literature
- US20100091627A1 OPTICAL DISK INSPECTION DEVICE AND INSPECTION METHOD Public/Granted day:2010-04-15
Information query
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