Invention Grant
US08270553B2 PLL circuit, communication device, and loopback test method of communication device
失效
通信设备的PLL电路,通信设备和环回测试方法
- Patent Title: PLL circuit, communication device, and loopback test method of communication device
- Patent Title (中): 通信设备的PLL电路,通信设备和环回测试方法
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Application No.: US12500063Application Date: 2009-07-09
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Publication No.: US08270553B2Publication Date: 2012-09-18
- Inventor: Kazuo Ogasawara , Masao Nakadaira
- Applicant: Kazuo Ogasawara , Masao Nakadaira
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Young & Thompson
- Priority: JP2008-196774 20080730
- Main IPC: H03D3/24
- IPC: H03D3/24

Abstract:
A controlling unit disposed in a PLL circuit controls a phase interpolator to gradually change a phase shift amount applied to a phase shift signal C_PS by a unit of basic delay amount Δ at a timing predetermined in accordance with a modulation profile of an SSC. Further, the controlling unit controls a total phase shift amount applied to the phase shift signal C_PS output from the phase interpolator in one period of a feedback clock signal C_FB obtained by dividing frequency of the phase shift signal C_PS in a way that a difference between the total phase shift amount and a total phase shift amount in a previous one period of C_FB is always equal to or less than the basic delay amount Δ.
Public/Granted literature
- US20100027586A1 PLL CIRCUIT, COMMUNICATION DEVICE, AND LOOPBACK TEST METHOD OF COMMUNICATION DEVICE Public/Granted day:2010-02-04
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