Invention Grant
- Patent Title: Sampling apparatus and sampling method
- Patent Title (中): 采样设备及采样方法
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Application No.: US12136064Application Date: 2008-06-10
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Publication No.: US08271222B2Publication Date: 2012-09-18
- Inventor: Eiji Kanoh , Takayuki Akita , Masayuki Kawabata
- Applicant: Eiji Kanoh , Takayuki Akita , Masayuki Kawabata
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Jianq Chyun IP Office
- Main IPC: G01R29/02
- IPC: G01R29/02 ; G01R29/00

Abstract:
Provided is a sampling apparatus that samples a signal under measurement, including a sample processing section that outputs sample data obtained by sampling the signal under measurement with a sampling timing at non-uniform intervals obtained by thinning a reference clock, a storage section that stores the sample data, and a waveform generating section that generates a waveform of the signal under measurement based on the sample data read from the storage section. The sample processing section includes a sampler that samples the signal under measurement in synchronization with the reference clock and a data thinning section that thins the sample data output by the sampler and outputs this thinned data as sample data with the sampling timing at non-uniform intervals.
Public/Granted literature
- US20090306917A1 SAMPLING APPARATUS AND SAMPLING METHOD Public/Granted day:2009-12-10
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