Invention Grant
- Patent Title: System and method for resource allocation of semiconductor testing industry
- Patent Title (中): 半导体测试行业资源配置系统与方法
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Application No.: US12545050Application Date: 2009-08-20
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Publication No.: US08271311B2Publication Date: 2012-09-18
- Inventor: Kung-Jeng Wang , Shih-Min Wang
- Applicant: Kung-Jeng Wang , Shih-Min Wang
- Applicant Address: TW Taipei
- Assignee: National Taiwan University of Science and Technology
- Current Assignee: National Taiwan University of Science and Technology
- Current Assignee Address: TW Taipei
- Agency: Jianq Chyun IP Office
- Priority: TW98101787A 20090117
- Main IPC: G06Q10/00
- IPC: G06Q10/00

Abstract:
A system and a method for resource allocation in the semiconductor testing industry are provided. In the system, an industry characteristic conversion module is used to transform the industry characteristic obtained from an input module into a chromosome structure. Next, an artificial intelligence evolution module proceeds to find an optimal solution by handling the chromosome structure until a candidate solution having a maximum final total profit converges to a value.
Public/Granted literature
- US20100185480A1 SYSTEM AND METHOD FOR RESOURCE ALLOCATION OF SEMICONDUCTOR TESTING INDUSTRY Public/Granted day:2010-07-22
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