Invention Grant
- Patent Title: Computer program and computer system for producing test flow
- Patent Title (中): 用于生产测试流程的计算机程序和计算机系统
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Application No.: US12958350Application Date: 2010-12-01
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Publication No.: US08271460B2Publication Date: 2012-09-18
- Inventor: Kazuhiko Iwasaki , Masayuki Arai , Kenichi Ichino
- Applicant: Kazuhiko Iwasaki , Masayuki Arai , Kenichi Ichino
- Applicant Address: JP Tokyo
- Assignee: Silicon Test Technologies. Inc.
- Current Assignee: Silicon Test Technologies. Inc.
- Current Assignee Address: JP Tokyo
- Agency: Apex Juris, pllc
- Agent Tracy M. Heims
- Priority: JP2009-272996 20091201
- Main IPC: G06F17/30
- IPC: G06F17/30

Abstract:
A program executed on a computer including storage, processing, output, and input units, the storage unit storing test-difficulty-calculation-elements-database, test-menu-database, and test-flow-database, for each test-menu-record, the program causing the processing unit to execute: calculating test-difficulty for each test-menu-record based on test-difficulty-calculation-formula by using at least one among pieces of information indicative of relationship with netlist, the number of package/test pins, expected operational clock frequency, process technology information, power consumption, and tester storage space; identifying all relationship between DFT scheme and priority, and causing the storage unit to store information indicative of the relationship between the DFT scheme and priority into the test-flow-database; and sorting the DFT scheme in an order of the priority based on the relationship between the DFT scheme and priority, causing the storage unit to store the DFT scheme as a test flow, and causing the output unit to output the test flow.
Public/Granted literature
- US20110131217A1 COMPUTER PROGRAM AND COMPUTER SYSTEM FOR PRODUCING TEST FLOW Public/Granted day:2011-06-02
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