Invention Grant
US08271835B2 Method for diagnosing abnormal conditions in a system by observing a computer screen and considering computer screen configuration complexity and distinctiveness
有权
通过观察计算机屏幕并考虑计算机屏幕配置的复杂性和独特性来诊断系统中的异常状况的方法
- Patent Title: Method for diagnosing abnormal conditions in a system by observing a computer screen and considering computer screen configuration complexity and distinctiveness
- Patent Title (中): 通过观察计算机屏幕并考虑计算机屏幕配置的复杂性和独特性来诊断系统中的异常状况的方法
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Application No.: US12344195Application Date: 2008-12-24
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Publication No.: US08271835B2Publication Date: 2012-09-18
- Inventor: Joon-Eon Yang , Won-Dea Jung , Jae-Whan Kim , Jin-Kyun Park
- Applicant: Joon-Eon Yang , Won-Dea Jung , Jae-Whan Kim , Jin-Kyun Park
- Applicant Address: KR Daejeon
- Assignee: Korea Atomic Energy Research Institute
- Current Assignee: Korea Atomic Energy Research Institute
- Current Assignee Address: KR Daejeon
- Agency: TIPS Group
- Priority: KR10-2008-0099640 20081010
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/30

Abstract:
The present invention discloses an apparatus and a method for diagnosing abnormal conditions, that quantitatively considers acquisition difficulties between abnormal symptoms provided on a computer screen and quantifies acquisition difficulties of the abnormal symptoms through distinctiveness of measuring devices to exactly diagnose the abnormal conditions even under an improved control environment, making it possible for a user to rapidly and easily diagnose the abnormal conditions that may be generated from a complicated device.With the present invention, the abnormal conditions are diagnosed using the sequential diagnosis technique and the Boolean logic between the abnormal symptoms, making it possible to effectively diagnose the abnormal conditions even under masking effects that may be generated between the abnormal symptoms.
Public/Granted literature
- US20100095153A1 Apparatus and Method for Diagnosing Abnormal Conditions Public/Granted day:2010-04-15
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