Invention Grant
- Patent Title: Hierarchical error injection for complex RAIM/ECC design
- Patent Title (中): 复杂RAIM / ECC设计的分层错误注入
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Application No.: US12823010Application Date: 2010-06-24
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Publication No.: US08271932B2Publication Date: 2012-09-18
- Inventor: Dean G. Bair , Patrick J. Meaney , Luis A. Lastras-Montano , Alia D. Shah , Eldee Stephens
- Applicant: Dean G. Bair , Patrick J. Meaney , Luis A. Lastras-Montano , Alia D. Shah , Eldee Stephens
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent John Campbell
- Main IPC: G06F11/22
- IPC: G06F11/22 ; G06F17/50
Abstract:
A computer-implemented method for verifying a RAIM/ECC design using a hierarchical injection scheme that includes selecting marks for generating an error mask, selecting a fixed bit mask based on the selected marks, determining whether to inject errors into at least one of a marked channel and at least one marked chip of a channel; and randomly injecting errors into the at least one of the marked channel and the at least one marked chip when determined.
Public/Granted literature
- US20110320872A1 HIERARCHICAL ERROR INJECTION FOR COMPLEX RAIM/ECC DESIGN Public/Granted day:2011-12-29
Information query
