Invention Grant
- Patent Title: Strain measurement device and method of strain measurement using the same
- Patent Title (中): 应变测量装置及其应变测量方法
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Application No.: US12850628Application Date: 2010-08-05
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Publication No.: US08272273B2Publication Date: 2012-09-25
- Inventor: Lu-Zhuo Chen , Chang-Hong Liu , Jia-Ping Wang , Shou-Shan Fan
- Applicant: Lu-Zhuo Chen , Chang-Hong Liu , Jia-Ping Wang , Shou-Shan Fan
- Applicant Address: CN Beijing TW Tu-Cheng, New Taipei
- Assignee: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Beijing TW Tu-Cheng, New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN200910188746 20091204
- Main IPC: G01B7/16
- IPC: G01B7/16

Abstract:
A strain measurement device includes a strain gauge, a holding device, a transverse strain recorder, and a data processing device. The strain gauge includes at least one first and at least one second layers of carbon nanotube films, each layer of carbon nanotube films having a plurality of carbon nanotubes. The carbon nanotubes in at least one first layer of carbon nanotube film align along a first direction. The carbon nanotubes in at least one second layer of carbon nanotube film align along a second direction. The holding device is used to fasten a specimen and the strain gauge. The transverse strain recorder is used to record a transverse strain of the strain gauge. The data processing device is used to calculate an axial strain of the strain gauge.
Public/Granted literature
- US20110137577A1 STRAIN MEASUREMENT DEVICE AND METHOD OF STRAIN MEASUREMENT USING THE SAME Public/Granted day:2011-06-09
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