Invention Grant
- Patent Title: Method for testing an electronics unit
- Patent Title (中): 电子单元测试方法
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Application No.: US12311247Application Date: 2007-10-02
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Publication No.: US08274295B2Publication Date: 2012-09-25
- Inventor: Udo Grittke , Axel Humpert , Dietmar Frühauf , Harald Schäuble
- Applicant: Udo Grittke , Axel Humpert , Dietmar Frühauf , Harald Schäuble
- Applicant Address: DE Maulburg
- Assignee: Endress + Hauser GmbH + Co. KG
- Current Assignee: Endress + Hauser GmbH + Co. KG
- Current Assignee Address: DE Maulburg
- Agency: Bacon & Thomas, PLLC
- Priority: DE102006047262 20061004
- International Application: PCT/EP2007/060481 WO 20071002
- International Announcement: WO2008/040744 WO 20080410
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A method for testing an electronics unit, especially an electronics unit of an apparatus for ascertaining and/or monitoring a process variable, wherein the electronics unit has a plurality of electrical components. At least a part of the electrical components is grouped into at least one group, and this group is supplied with a query signal. A response signal is received from the group, and the response signal is evaluated. Furthermore, the invention relates to an apparatus for determining and/or monitoring a process variable.
Public/Granted literature
- US20100164506A1 Method for testing an electronics unit Public/Granted day:2010-07-01
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