Invention Grant
- Patent Title: Memory device and operating method thereof
- Patent Title (中): 存储器件及其操作方法
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Application No.: US12780938Application Date: 2010-05-17
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Publication No.: US08274827B2Publication Date: 2012-09-25
- Inventor: Riichiro Shirota , Te-Chang Tseng
- Applicant: Riichiro Shirota , Te-Chang Tseng
- Applicant Address: TW Hsinchu County
- Assignee: RobustFlash Technologies Ltd.
- Current Assignee: RobustFlash Technologies Ltd.
- Current Assignee Address: TW Hsinchu County
- Agency: Jianq Chyun IP Office
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
The invention provides a memory device on a substrate. The memory device comprises semiconductor layers, common word lines, common bit lines and a common source line. The semiconductor layers are stacked on the substrate, wherein each semiconductor layer has a plurality of NAND strings, and each NAND string includes memory cells and at least a string selection transistor. The common word lines are configured above the semiconductor layers, wherein each common word line is coupled to the memory cells arranged in a same row of the semiconductor layers. The common bit lines are configured on the common word lines, wherein each common bit line is coupled to a first ends of the NAND strings arranged in the same column of the semiconductor layers. The common source line is configured on the common word lines and coupled to a second ends of the NAND strings of the semiconductor layers.
Public/Granted literature
- US20110280075A1 MEMORY DEVICE AND OPERATING METHOD THEREOF Public/Granted day:2011-11-17
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