Invention Grant
- Patent Title: Magnetoelectric susceptibility measurement method and the system thereof
- Patent Title (中): 磁电磁测量方法及其系统
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Application No.: US12441380Application Date: 2007-10-05
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Publication No.: US08275427B2Publication Date: 2012-09-25
- Inventor: Kee hoon Kim , Yoon seok Oh
- Applicant: Kee hoon Kim , Yoon seok Oh
- Applicant Address: KR Seoul
- Assignee: Seoul National University Industry Foundation
- Current Assignee: Seoul National University Industry Foundation
- Current Assignee Address: KR Seoul
- Priority: KR10-2006-0123845 20061207
- International Application: PCT/KR2007/004860 WO 20071005
- International Announcement: WO2008/069423 WO 20080612
- Main IPC: G01R33/035
- IPC: G01R33/035

Abstract:
Disclosed herein is a method and system for measuring magnetoelectric susceptibility. The system includes a magnet supplying a DC magnetic bias to a magnetoelectric sample, an AC drive coil applying an AC magnetic field to the magnetoelectric sample, a charge amplifier amplifying an electric charge signal of the magnetoelectric sample oscillating by the AC magnetic field, and a phase sensitive detector detecting the voltage signal produced by the charge amplifier while supplying induction current to the AC drive coil. Accordingly, it is possible to provide a highly sensitive system for measuring magnetoelectric susceptibility, which is essential for research on multiferroic and magnetoelectric bulk and thin film materials at room temperature, and can also operate in the physical property measurement system (PPMS, manufactured by Quantum Design Co., Ltd.) for measurements under low temperature and high magnetic field environments.
Public/Granted literature
- US20090270262A1 MAGNETOELECTRIC SUSCEPTIBILITY MEASUREMENT METHOD AND THE SYSTEM THEREOF Public/Granted day:2009-10-29
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