Invention Grant
- Patent Title: Measuring apparatus and measuring method
- Patent Title (中): 测量装置和测量方法
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Application No.: US12408338Application Date: 2009-03-20
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Publication No.: US08275566B2Publication Date: 2012-09-25
- Inventor: Kanato Kobayashi , Takeshi Tsukanaka
- Applicant: Kanato Kobayashi , Takeshi Tsukanaka
- Applicant Address: JP Nagano
- Assignee: T & D Corporation
- Current Assignee: T & D Corporation
- Current Assignee Address: JP Nagano
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: JP2008-272195 20081022
- Main IPC: G01K15/00
- IPC: G01K15/00 ; G01K3/00

Abstract:
An apparatus including a recording switch for recording a temperature of an object; a judging unit that measures the temperature of the object using a sensor at intervals and judges whether a difference in temperatures measured at the intervals is within a range of a pre-set value; a first acquisition unit that records and/or outputs, when a switch-on of the recording switch is detected and the difference in temperatures is within the range of the pre-set value, information including a first temperature measured using the sensor and has become valid by the switch-on of the recording switch; and a second acquisition unit that records and/or outputs, when the switch-on is detected and the difference in temperatures is outside the range information including a second temperature measured using the sensor and becomes valid when the difference in temperatures falls within the range after the switch-on is detected.
Public/Granted literature
- US20100100351A1 MEASURING APPARATUS AND MEASURING METHOD Public/Granted day:2010-04-22
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