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US08275738B2 Radio frequency microscope for amplifying and analyzing electromagnetic signals by positioning the monitored system at a locus of an ellipsoidal surface 有权
射频显微镜，用于通过将监测的系统定位在椭圆面的轨迹上来放大和分析电磁信号

Radio frequency microscope for amplifying and analyzing electromagnetic signals by positioning the monitored system at a locus of an ellipsoidal surface
Abstract:
One embodiment provides a technique for analyzing a target electromagnetic signal radiating from a monitored system. During the technique, the monitored system is positioned at a first locus of an ellipsoidal surface to amplify the target electromagnetic signal received at a second locus of the ellipsoidal surface. Next, the amplified target electromagnetic signal is monitored using an antenna positioned at the second locus of the ellipsoidal surface. Finally, the integrity of the monitored system is assessed by analyzing the amplified target electromagnetic signal monitored by the antenna.
Abstract(Chinese):

一个实施例提供了一种用于分析从被监视系统辐射的目标电磁信号的技术。 在该技术期间，所监视的系统位于椭圆面的第一轨迹处，以放大在椭圆面的第二轨迹处接收到的目标电磁信号。 接下来，使用位于椭圆面的第二轨迹处的天线来监视放大的目标电磁信号。 最后，通过分析由天线监测的放大的目标电磁信号来评估监控系统的完整性。

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