Invention Grant
US08278193B2 Methods of forming layers of semiconductor material having reduced lattice strain, semiconductor structures, devices and engineered substrates including same
有权
形成具有减小的晶格应变的半导体材料层的方法,半导体结构,器件和包括其的工程化基板
- Patent Title: Methods of forming layers of semiconductor material having reduced lattice strain, semiconductor structures, devices and engineered substrates including same
- Patent Title (中): 形成具有减小的晶格应变的半导体材料层的方法,半导体结构,器件和包括其的工程化基板
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Application No.: US12576116Application Date: 2009-10-08
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Publication No.: US08278193B2Publication Date: 2012-10-02
- Inventor: Chantal Arena
- Applicant: Chantal Arena
- Applicant Address: FR Bernin
- Assignee: SOITEC
- Current Assignee: SOITEC
- Current Assignee Address: FR Bernin
- Agency: TraskBritt
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
Methods of fabricating semiconductor devices or structures include forming structures of a semiconductor material overlying a layer of a compliant material, subsequently changing the viscosity of the compliant material to relax the semiconductor material structures, and utilizing the relaxed semiconductor material structures as a seed layer in forming a continuous layer of relaxed semiconductor material. In some embodiments, the layer of semiconductor material may comprise a III-V type semiconductor material, such as, for example, indium gallium nitride. Novel intermediate structures are formed during such methods. Engineered substrates include a continuous layer of semiconductor material having a relaxed lattice structure.
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