Invention Grant
- Patent Title: Device for mass spectrometry, and mass spectrometry apparatus and method
- Patent Title (中): 质谱装置,质谱装置及方法
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Application No.: US12561040Application Date: 2009-09-16
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Publication No.: US08278626B2Publication Date: 2012-10-02
- Inventor: Naoki Murakami , Hisashi Ohtsuka , Morihito Ikeda
- Applicant: Naoki Murakami , Hisashi Ohtsuka , Morihito Ikeda
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2008-237681 20080917
- Main IPC: H01J27/24
- IPC: H01J27/24 ; H01J49/16

Abstract:
In a device for mass spectrometry, an analyte contained in a sample is desorbed from a surface of the device by irradiating the sample in contact with the surface with measurement light. The device includes a micro-structure having a plurality of metal bodies on a surface of a substrate, and the plurality of metal bodies have sizes that can excite localized plasmons by irradiation with the measurement light. Further, the device includes an initiator fixed at least to a part of a surface of the micro-structure.
Public/Granted literature
- US20100065735A1 DEVICE FOR MASS SPECTROMETRY, AND MASS SPECTROMETRY APPARATUS AND METHOD Public/Granted day:2010-03-18
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