Invention Grant
- Patent Title: Contact hole, semiconductor device and method for forming the same
- Patent Title (中): 接触孔,半导体器件及其形成方法
-
Application No.: US13119513Application Date: 2011-02-24
-
Publication No.: US08278721B2Publication Date: 2012-10-02
- Inventor: Huicai Zhong , Qingqing Liang
- Applicant: Huicai Zhong , Qingqing Liang
- Applicant Address: CN Beijing
- Assignee: Institute of Microelectronics, Chinese Academy of Sciences
- Current Assignee: Institute of Microelectronics, Chinese Academy of Sciences
- Current Assignee Address: CN Beijing
- Agency: Goodwin Procter LLP
- Priority: CN201010175815 20100514
- International Application: PCT/CN2011/071254 WO 20110224
- International Announcement: WO2011/140850 WO 20111117
- Main IPC: H01L21/02
- IPC: H01L21/02

Abstract:
The invention provides a method for forming a contact plug, comprising: forming a gate, a sidewall spacer, a sacrificial sidewall spacer, a source region and a drain region on a substrate, wherein the sidewall spacer is formed around the gate, the sacrificial sidewall spacer is formed over the sidewall spacer, and the source region and the drain region are formed within the substrate and on respective sides of the gate; forming an interlayer dielectric layer, with the gate, the sidewall spacer and the sacrificial sidewall spacer being exposed; removing the sacrificial sidewall spacer to form a contact space, the sacrificial sidewall spacer material being different from that of the gate, the sidewall spacer and the interlayer dielectric layer; forming a conducting layer to fill the contact space; and cutting off the conducting layer, to form at least two conductors connected to the source region and the drain region respectively.
Public/Granted literature
- US20110281413A1 CONTACT HOLE, SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME Public/Granted day:2011-11-17
Information query
IPC分类: