Invention Grant
- Patent Title: Particulate matter detection device and method for manufacturing the same
- Patent Title (中): 颗粒物检测装置及其制造方法
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Application No.: US12559762Application Date: 2009-09-15
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Publication No.: US08278907B2Publication Date: 2012-10-02
- Inventor: Takeshi Sakuma , Atsuo Kondo , Takashi Egami
- Applicant: Takeshi Sakuma , Atsuo Kondo , Takashi Egami
- Applicant Address: JP Nagoya
- Assignee: NGK Insulators, Ltd.
- Current Assignee: NGK Insulators, Ltd.
- Current Assignee Address: JP Nagoya
- Agency: Burr & Brown
- Priority: JP2008-246461 20080925
- Main IPC: G01N27/00
- IPC: G01N27/00

Abstract:
A particulate matter detection device including a detection device main body which has one end provided with a through hole a pair of electrodes embedded in a wall through which the through hole is formed, and covered with a dielectric material; wires extending from the electrodes to the other end of the main body; and a ground electrode provided at a position sandwiched between the wires. The device can electrically adsorb, on the wall surface of the through hole, a charged particle in a fluid flowing into the through hole, or a particle charged by electric discharge caused in the through hole by applying a voltage across the pair of electrodes. The device can measure the changes of the electric properties of the wall through which the through hole is formed, thereby detecting particles adsorbed on the wall surface of the through hole.
Public/Granted literature
- US20100071441A1 PARTICULATE MATTER DETECTION DEVICE AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2010-03-25
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