Invention Grant
- Patent Title: Circuit board unit and testing apparatus
- Patent Title (中): 电路板单元和测试仪器
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Application No.: US12784333Application Date: 2010-05-20
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Publication No.: US08278957B2Publication Date: 2012-10-02
- Inventor: Hiroshi Sakata , Ken Miyata
- Applicant: Hiroshi Sakata , Ken Miyata
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Chen Yoshimura LLP
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
Provided is a circuit board unit for connecting a connecting terminal of a testing apparatus to a connected terminal of a device under test, including: a circuit board having, on one surface, a contact corresponding to the connected terminal; and a connector guide provided on the one surface of the circuit board, the connector guide guiding a connector having the connecting terminal to the circuit board, and pulling the connector towards the circuit board. In this circuit board unit, the connector guide may bias the connector on a side of the connecting terminal, towards the circuit board. Moreover in the circuit board unit, the circuit board may further have a substrate frame that is coupled to the connector guide and biases the connector guide towards the circuit board.
Public/Granted literature
- US20100301889A1 CIRCUIT BOARD UNIT AND TESTING APPARATUS Public/Granted day:2010-12-02
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