Invention Grant
- Patent Title: Transfer circuit, transmitter, receiver and test apparatus
- Patent Title (中): 传输电路,发射机,接收机和测试仪器
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Application No.: US12700703Application Date: 2010-02-04
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Publication No.: US08278962B2Publication Date: 2012-10-02
- Inventor: Daisuke Watanabe , Toshiyuki Okayasu
- Applicant: Daisuke Watanabe , Toshiyuki Okayasu
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Chen Yoshimura LLP
- Priority: JP2007-229462 20070904
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
There is provided a transfer circuit including a transmitter that outputs a transmission signal and a receiver that receives the transmission signal. Here, the receiver supplies to the transmitter a feedback signal for controlling a common level of the transmission signal output from the transmitter, and the transmitter controls the common level of the transmission signal output therefrom, in accordance with the feedback signal received from the receiver. The receiver includes a receiving section that operates in accordance with the transmission signal, a reference level generating section that generates a reference level representing an expected level for the common level of the transmission signal input into the receiving section, and a comparing section that compares the common level of the transmission signal input into the receiving section against the reference level and generates the feedback signal in accordance with a result of the comparison.
Public/Granted literature
- US20100208780A1 TRANSFER CIRCUIT, TRANSMITTER, RECEIVER AND TEST APPARATUS Public/Granted day:2010-08-19
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