Invention Grant
- Patent Title: Inspection apparatus
- Patent Title (中): 检验仪器
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Application No.: US12772557Application Date: 2010-05-03
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Publication No.: US08278965B2Publication Date: 2012-10-02
- Inventor: Kenichi Washio , Katsuo Yasuta , Toshikazu Oshima , Takehiko Hirai
- Applicant: Kenichi Washio , Katsuo Yasuta , Toshikazu Oshima , Takehiko Hirai
- Applicant Address: JP
- Assignee: Kabushiki Kaisha Nihon Micronics
- Current Assignee: Kabushiki Kaisha Nihon Micronics
- Current Assignee Address: JP
- Agency: Bacon & Thomas, PLLC
- Priority: JP2009-120106 20090518
- Main IPC: G01R31/40
- IPC: G01R31/40

Abstract:
The inspection apparatus includes a probe having a contact for contacting an electrode of an inspected object and having a built-in heater for correcting dislocation of the contact to the electrode caused by temperature difference between the probe and the inspected object; a tester for testing the probe and supplying electric power to the heater; an electric power supply, provided on the tester, for supplying electric power to the heater; and a temperature control unit for controlling electric power to the heater of the probe through the electric power supply, wherein the electric power supply includes at least one open/close switch for switching power to the heater on and off. A connector has a male connector and a female connector on opposing ends. A continuity-checking device checks supply of electric power to the heater from the electric power supply.
Public/Granted literature
- US20100289514A1 INSPECTION APPARATUS Public/Granted day:2010-11-18
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