Invention Grant
US08278967B2 Data driving impedance auto-calibration circuit and semiconductor integrated circuit using the same
有权
数据驱动阻抗自动校准电路和半导体集成电路使用相同
- Patent Title: Data driving impedance auto-calibration circuit and semiconductor integrated circuit using the same
- Patent Title (中): 数据驱动阻抗自动校准电路和半导体集成电路使用相同
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Application No.: US12844474Application Date: 2010-07-27
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Publication No.: US08278967B2Publication Date: 2012-10-02
- Inventor: Won Kyung Chung
- Applicant: Won Kyung Chung
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2009-0093597 20090930
- Main IPC: H03K17/16
- IPC: H03K17/16 ; H03K19/003
Abstract:
A data driving impedance auto-calibration circuit includes: a detection block configured to calibrate a characteristic voltage generated by detecting an operation characteristic variation of an element, according to a code signal, and generate a calibrated characteristic voltage; a comparison block configured to compare the calibrated characteristic voltage with a reference voltage and output a comparison result signal; and a code calibration block configured to calibrate the code signal according to the comparison result signal.
Public/Granted literature
- US20110074462A1 DATA DRIVING IMPEDANCE AUTO-CALIBRATION CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT USING THE SAME Public/Granted day:2011-03-31
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