Invention Grant
US08279654B2 Resistance change memory device and operation method of the same 有权
电阻变化记忆体及其操作方法相同

  • Patent Title: Resistance change memory device and operation method of the same
  • Patent Title (中): 电阻变化记忆体及其操作方法相同
  • Application No.: US12755823
    Application Date: 2010-04-07
  • Publication No.: US08279654B2
    Publication Date: 2012-10-02
  • Inventor: Wataru Otsuka
  • Applicant: Wataru Otsuka
  • Applicant Address: JP Tokyo
  • Assignee: Sony Corporation
  • Current Assignee: Sony Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: SNR Denton US LLP
  • Priority: JP2009-098639 20090415
  • Main IPC: G11C11/00
  • IPC: G11C11/00
Resistance change memory device and operation method of the same
Abstract:
A resistance change memory device includes: memory cells each having a current path in which a storage element, whose resistance changes according to the voltage applied, and an access transistor are connected in series; first wirings each connected to one end of the current path; second wirings each connected to the other end of the current path; a well which is a semiconductor region in which the access transistors are formed; and a drive circuit.
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