Invention Grant
- Patent Title: Resistance change memory device and operation method of the same
- Patent Title (中): 电阻变化记忆体及其操作方法相同
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Application No.: US12755823Application Date: 2010-04-07
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Publication No.: US08279654B2Publication Date: 2012-10-02
- Inventor: Wataru Otsuka
- Applicant: Wataru Otsuka
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: SNR Denton US LLP
- Priority: JP2009-098639 20090415
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A resistance change memory device includes: memory cells each having a current path in which a storage element, whose resistance changes according to the voltage applied, and an access transistor are connected in series; first wirings each connected to one end of the current path; second wirings each connected to the other end of the current path; a well which is a semiconductor region in which the access transistors are formed; and a drive circuit.
Public/Granted literature
- US20100265757A1 RESISTANCE CHANGE MEMORY DEVICE AND OPERATION METHOD OF THE SAME Public/Granted day:2010-10-21
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