Invention Grant
- Patent Title: High read speed memory with gate isolation
- Patent Title (中): 具有门隔离的高速读存储器
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Application No.: US12824352Application Date: 2010-06-28
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Publication No.: US08279674B2Publication Date: 2012-10-02
- Inventor: Richard Fastow , Hagop Nazarian , Lei Xue
- Applicant: Richard Fastow , Hagop Nazarian , Lei Xue
- Applicant Address: US CA Sunnyvale
- Assignee: Spansion LLC
- Current Assignee: Spansion LLC
- Current Assignee Address: US CA Sunnyvale
- Agency: Turocy & Watson, LLP
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/04 ; G11C5/06

Abstract:
Providing for a serial array memory transistor architecture that achieves high read speeds compared with conventional serial array memory is described herein. By way of example, the serial array memory can be connected to and can drive a gate voltage of a small capacitance pass transistor, to facilitate sensing memory transistors of the serial array. The pass transistor modulates current flow or voltage at an adjacent metal bitline, which can be utilized to sense a program or erase state(s) of the memory transistors. Due to the small capacitance of the pass transistor, read latency for the serial array can be significantly lower than conventional serial array memory (e.g., NAND memory). Further, various mechanisms for forming an amplifier region of the serial array memory comprising discrete pass transistor are described to facilitate efficient fabrication of the serial array memory transistor architecture.
Public/Granted literature
- US20110317466A1 HIGH READ SPEED MEMORY WITH GATE ISOLATION Public/Granted day:2011-12-29
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