Invention Grant
- Patent Title: Method of operating nonvolatile memory device
- Patent Title (中): 操作非易失性存储器件的方法
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Application No.: US12780492Application Date: 2010-05-14
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Publication No.: US08279676B2Publication Date: 2012-10-02
- Inventor: Tai Sik Shin , Kwang Ho Baek
- Applicant: Tai Sik Shin , Kwang Ho Baek
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2009-0058485 20090629
- Main IPC: G11C16/02
- IPC: G11C16/02

Abstract:
A method of operating a nonvolatile memory device includes reading data stored in a main cell and a flag cell using a first read voltage, the nonvolatile memory device comprising the main cell for storing data including a least significant bit (LSB) and a most significant bit (MSB), and the flag cell for determining a program state of the main cell, determining a program state of the main cell based on the data read from the flag cell, reading data stored in the main cell and the flag cell using a second read voltage if a MSB page program has been performed on the main cell, and reading data stored in the main cell using a third or a fourth read voltage based on the data read from the flag cell using the second read voltage, if a threshold voltage of the main cell shifts.
Public/Granted literature
- US20100329015A1 METHOD OF OPERATING NONVOLATILE MEMORY DEVICE Public/Granted day:2010-12-30
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