Invention Grant
- Patent Title: Semiconductor device
- Patent Title (中): 半导体器件
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Application No.: US13102295Application Date: 2011-05-06
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Publication No.: US08279696B2Publication Date: 2012-10-02
- Inventor: Masao Shinozaki
- Applicant: Masao Shinozaki
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Mattingly & Malur, PC
- Priority: JP2008-168093 20080627
- Main IPC: G11C7/02
- IPC: G11C7/02

Abstract:
There is provided a technique for ensuring both an SNM and a write margin simultaneously in a semiconductor device having static memory cells. A semiconductor device has a plurality of static memory cells. The semiconductor device includes a memory cell array having the static memory cells arranged in a matrix, a temperature sensor circuit for sensing a temperature in the semiconductor device, and a word driver for controlling a voltage supplied to a word line of the memory cell array based on an output of the temperature sensor circuit at the time of writing to or reading from a memory cell.
Public/Granted literature
- US20110211385A1 SEMICONDUCTOR DEVICE Public/Granted day:2011-09-01
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