Invention Grant
- Patent Title: Sample analyzing apparatus
- Patent Title (中): 样品分析仪
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Application No.: US13230056Application Date: 2011-09-12
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Publication No.: US08279715B2Publication Date: 2012-10-02
- Inventor: Yuji Wakamiya , Tomohiro Okuzaki , Hisato Takehara
- Applicant: Yuji Wakamiya , Tomohiro Okuzaki , Hisato Takehara
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2007-119770 20070427; JP2007-123999 20070508
- Main IPC: G04B47/00
- IPC: G04B47/00 ; G04C17/00 ; G01N21/00
Abstract:
A sample analyzing apparatus is provided with a memory for storing a schedule of maintenance, a display, and a controller for displaying on the display a screen of calendar format, wherein the screen includes a date display area for displaying a date and a maintenance item display area for displaying a maintenance item scheduled on the date.
Public/Granted literature
- US20120004742A1 SAMPLE ANALYZING APPARATUS Public/Granted day:2012-01-05
Information query
IPC分类:
