Invention Grant
- Patent Title: Iris recognition system using quality metrics
- Patent Title (中): 虹膜识别系统使用质量指标
-
Application No.: US12329346Application Date: 2008-12-05
-
Publication No.: US08280119B2Publication Date: 2012-10-02
- Inventor: Rida Hamza
- Applicant: Rida Hamza
- Applicant Address: US NJ Morristown
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morristown
- Agency: Seager, Tufte, & Wickhem LLC.
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A system for iris recognition using a set of quality metrics, which may include eye image validation, blur assessment, offset, gazing, obscuration, visibility, and the like. These metrics may be established as quantitative measures which can automatically assess the quality of eye images before they are processed for recognition purposes. Quadrant iris analysis, histograms, map processing enhancements, and multi-band analysis may be used in aiding in the iris recognition approach.
Public/Granted literature
- US20100142765A1 IRIS RECOGNITION SYSTEM USING QUALITY METRICS Public/Granted day:2010-06-10
Information query