Invention Grant
US08280145B2 System for non-destructively examining degradation of an interior of a device
有权
用于非破坏性地检查设备内部的劣化的系统
- Patent Title: System for non-destructively examining degradation of an interior of a device
- Patent Title (中): 用于非破坏性地检查设备内部的劣化的系统
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Application No.: US13236301Application Date: 2011-09-19
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Publication No.: US08280145B2Publication Date: 2012-10-02
- Inventor: James J. Kovarik , Brent D. Burns , Kevin J. Urness
- Applicant: James J. Kovarik , Brent D. Burns , Kevin J. Urness
- Agency: Sheridan Ross P.C.
- Main IPC: G06K9/00
- IPC: G06K9/00
Abstract:
A system and method for monitoring degradation of a device having a metal layer and a composite layer, such as a vehicle-mounted boom arm. The system can include a collar mounted on an outer surface of the device, a radiography device movably coupled to the collar, and a monitor. The radiography device can include a source of radiography signals positioned to direct radiography signals through at least a portion of the device and a detector to detect radiography signals that have passed through the device. The monitor can be connected to the detector to display an image of the device generated from the detected radiography signals. Anomalies in the device image can represent degradation in the device.
Public/Granted literature
- US20120033788A1 System for Non-Destructively Examining Degradation of an Interior of a Device Public/Granted day:2012-02-09
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