Invention Grant
- Patent Title: Method and apparatus for determining similarity between surfaces
- Patent Title (中): 用于确定表面之间相似度的方法和装置
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Application No.: US12086623Application Date: 2006-12-17
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Publication No.: US08280150B2Publication Date: 2012-10-02
- Inventor: Ron Kimmel , Alexander Bronstein , Michael Bronstein
- Applicant: Ron Kimmel , Alexander Bronstein , Michael Bronstein
- Applicant Address: IL Haifa
- Assignee: Technion Research & Development Foundation Ltd.
- Current Assignee: Technion Research & Development Foundation Ltd.
- Current Assignee Address: IL Haifa
- Agency: Graeser Associates International Inc
- Agent D'vorah Graeser
- International Application: PCT/IL2006/001451 WO 20061217
- International Announcement: WO2007/069260 WO 20070621
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method for determining similarity between a non-planar probe surface and a non-planar model surface is disclosed. The method comprises calculating an extremal value of an objective function describing embedding of the probe surface into an embedding space having a non-constant sectional curvature; and determining similarity between the probe surface and the model surface based on the extremal value.
Public/Granted literature
- US20090028442A1 Method And Apparatus For Determining Similarity Between Surfaces Public/Granted day:2009-01-29
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