中科微点-全球专利检索

  1. Login
  2. Sign Up
Invention Grant
US08281194B2 Scan path switch testing of output buffer with ESD 有权
输出缓冲器的ESD扫描路径开关测试

  • Patent Title: Scan path switch testing of output buffer with ESD
  • Patent Title (中): 输出缓冲器的ESD扫描路径开关测试
  • Application No.: US13352484
    Application Date: 2012-01-18
  • Publication No.: US08281194B2
    Publication Date: 2012-10-02
  • Inventor: Lee D. Whetsel
  • Applicant: Lee D. Whetsel
  • Applicant Address: US TX Dallas
  • Assignee: Texas Instruments Incorporated
  • Current Assignee: Texas Instruments Incorporated
  • Current Assignee Address: US TX Dallas
  • Agent Lawrence J. Bassuk; W. James Brady; Frederick J. Telecky, Jr.
  • Main IPC: G01R31/28
  • IPC: G01R31/28
Scan path switch testing of output buffer with ESD
Abstract:
The peripheral circuitry (350, 360, ESD, BH) of an integrated circuit die on a wafer is tested without physically contacting the bond pads of the die.
Abstract(Chinese):

测试晶片上的集成电路管芯的外围电路（350,360，ESD，BH），而不会物理接触管芯的接合焊盘。

Public/Granted literature
Information query
Espacenet
Patent Agency Ranking
0/0