Invention Grant
US08281266B2 Systematic, normalized metric for analyzing and comparing optimization techniques for integrated circuits employing voltage scaling and integrated circuits designed thereby 失效
用于分析和比较采用电压缩放的集成电路和由此设计的集成电路的优化技术的系统的归一化度量

  • Patent Title: Systematic, normalized metric for analyzing and comparing optimization techniques for integrated circuits employing voltage scaling and integrated circuits designed thereby
  • Patent Title (中): 用于分析和比较采用电压缩放的集成电路和由此设计的集成电路的优化技术的系统的归一化度量
  • Application No.: US12365010
    Application Date: 2009-02-03
  • Publication No.: US08281266B2
    Publication Date: 2012-10-02
  • Inventor: Joseph J. JamannJames C. ParkerVishwas M. Rao
  • Applicant: Joseph J. JamannJames C. ParkerVishwas M. Rao
  • Applicant Address: US DE Wilmington
  • Assignee: Agere Systems LLC
  • Current Assignee: Agere Systems LLC
  • Current Assignee Address: US DE Wilmington
  • Main IPC: G06F17/50
  • IPC: G06F17/50
Systematic, normalized metric for analyzing and comparing optimization techniques for integrated circuits employing voltage scaling and integrated circuits designed thereby
Abstract:
Various embodiments of methods of designing an integrated circuit (IC). One embodiment of one such method includes: (1) generating a functional design for the IC, (2) determining performance objectives for the IC, (3) determining an optimization target voltage for the IC, (4) determining whether the IC needs voltage scaling to achieve the performance objectives at the optimization target voltage and, if so, whether the IC is to employ static voltage scaling or adaptive voltage scaling, (5) using the optimization target voltage to synthesize a layout from the functional IC design that meets the performance objectives by employing a unitless performance/power quantifier as a metric to gauge a degree of optimization thereof and (6) performing a timing signoff of the layout at the optimization target voltage.
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