Invention Grant
- Patent Title: Creating scan chain definition from high-level model using high-level model simulation
- Patent Title (中): 使用高级模型模拟从高级模型创建扫描链定义
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Application No.: US12963246Application Date: 2010-12-08
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Publication No.: US08281279B2Publication Date: 2012-10-02
- Inventor: William B. Maloney , Timothy M. Skergan
- Applicant: William B. Maloney , Timothy M. Skergan
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Stephen R. Tkacs; Stephen J. Walder, Jr.; Matthew B. Talpis
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F11/22 ; G01R31/28

Abstract:
Mechanisms are provided for creating shift register definition from high-level model using high-level model simulation. The mechanisms initialize all potential scan chain latches, identify the latches in a given scan chain, and separate the scan chain latches into chunks. For each chunk, the mechanisms identify the latches within the chunk that change at each shift. The mechanisms isolate the scan path latch when divergence occurs.
Public/Granted literature
- US20120151288A1 Creating Scan Chain Definition from High-Level Model Using High-Level Model Simulation Public/Granted day:2012-06-14
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