Invention Grant
- Patent Title: Material testing apparatus with non-contact sensor
- Patent Title (中): 具有非接触式传感器的材料试验装置
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Application No.: US12337318Application Date: 2008-12-17
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Publication No.: US08281648B2Publication Date: 2012-10-09
- Inventor: Pierre Leroux
- Applicant: Pierre Leroux
- Applicant Address: US CA Irvine
- Assignee: Nanovea, Inc.
- Current Assignee: Nanovea, Inc.
- Current Assignee Address: US CA Irvine
- Agency: Knobbe Martens Olson & Bear LLP
- Main IPC: G01N3/48
- IPC: G01N3/48 ; G01N3/42
Abstract:
A non-contact sensor is attached to the indenting module with its working range encompassing the tip of the indenter. The sensor directly measures penetration depth of the indenter during scratch, wear or instrumented hardness testing. During the test, the non-contact sensor records the height of the surface as the indenter penetrates the surface of the testing specimen.
Public/Granted literature
- US20090158826A1 MATERIAL TESTING APPARATUS WITH NON-CONTACT SENSOR Public/Granted day:2009-06-25
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