Invention Grant
US08283629B1 Aberration-corrected wien ExB mass filter with removal of neutrals from the Beam
有权
经过修正的wien ExB质量过滤器,从梁中移除中性粒子
- Patent Title: Aberration-corrected wien ExB mass filter with removal of neutrals from the Beam
- Patent Title (中): 经过修正的wien ExB质量过滤器,从梁中移除中性粒子
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Application No.: US13089991Application Date: 2011-04-19
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Publication No.: US08283629B1Publication Date: 2012-10-09
- Inventor: David Tuggle , N. William Parker , Mark W. Utlaut
- Applicant: David Tuggle , N. William Parker , Mark W. Utlaut
- Applicant Address: US OR Hillsboro
- Assignee: FEI Company
- Current Assignee: FEI Company
- Current Assignee Address: US OR Hillsboro
- Agency: Scheinberg & Associates, PC
- Agent Michael O. Scheinberg
- Main IPC: H01J40/00
- IPC: H01J40/00 ; H01J47/00 ; H01J3/14

Abstract:
A mass filter for an ion beam system includes at least two stages and reduces chromatic aberration. One embodiment includes two symmetrical mass filter stages, the combination of which reduces or eliminates chromatic aberration, and entrance and exit fringing field errors. Embodiments can also prevent neutral particles from reaching the sample surface and avoid crossovers in the beam path. In one embodiment, the filter can pass a single species of ion from a source that produces multiple species. In other embodiments, the filter can pass a single ion species with a range of energies and focus the multi-energetic ions at the same point on the substrate surface.
Public/Granted literature
- US20120261566A1 ABERRATION-CORRECTED WIEN EXB MASS FILTER WITH REMOVAL OF NEUTRALS FROM THE BEAM Public/Granted day:2012-10-18
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