Invention Grant
- Patent Title: Integrated circuit system with metal and semi-conducting gate
- Patent Title (中): 具有金属和半导体栅极的集成电路系统
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Application No.: US11611856Application Date: 2006-12-16
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Publication No.: US08283718B2Publication Date: 2012-10-09
- Inventor: Angela T. Hui , Mark S. Chang , Kuo-Tung Chang , Scott A. Bell
- Applicant: Angela T. Hui , Mark S. Chang , Kuo-Tung Chang , Scott A. Bell
- Applicant Address: US CA Sunnyvale US CA Sunnyvale
- Assignee: Spansion LLC,Advanced Micro Devices, Inc.
- Current Assignee: Spansion LLC,Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Sunnyvale US CA Sunnyvale
- Agency: Farjami & Farjami LLP
- Main IPC: H01L29/792
- IPC: H01L29/792

Abstract:
A method for forming an integrated circuit system is provided including forming a semi-conducting layer over a substrate, forming a spacer stack having a gap filler adjacent to the semi-conducting layer and a inter-layer dielectric over the gap filler, forming a transition layer having a recess over the semi-conducting layer and adjacent to the spacer stack, and forming a metal layer in the recess.
Public/Granted literature
- US20080142873A1 INTEGRATED CIRCUIT SYSTEM WITH METAL AND SEMI-CONDUCTING GATE Public/Granted day:2008-06-19
Information query
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